list of questions for vendors

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#100 opened on Mar 20, 2025 1 comment 0 reactions 1 assignee View on GitHub

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@KrisThielemans is already working on this.

Since Mar 20, 2025.

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Detector material specification (what level of detail can be provided), see BulkMaterial
Do we need “stretchable” TOF bins (i.e. keep number of TOF bins fixed, as opposed to keep "length" of TOF bin fixed)? We believe that all scanners use the latter. Related is #182
What types of coincidence policy do we need to support. See #21
Do we need flags for broken/unreliable modules? See #88
Is a 32-bit unsigned int enough to enumerate all possible (single) detection bins (usually number of "crystals" * number of energy windows)?
Is it ok to assume dead-time and singles are recorded at either module or element level? (see #119)
At present, we have no independent calibration factor (i.e. it is absorbed into the other components). Is this sufficient? (e.g. does the calibration factor change more often than the other components?) Edit: the calibration factor is now part of DetectionEfficiencies

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