go-kit/kit

Fix sd/etcd and sd/etcdv3 integration test flakes

Open

#882 建立於 2019年6月6日

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bughelp wanted

描述

The sd/etcd and sd/etcdv3 integration tests are extremely flaky. I can generally expect them to trigger build failures on every PR. Here is one example.

I am going to disable those tests until they can be fixed. This issue is a plea for help from the community to fix them.

貢獻者指南

技術棧
go
領域
backendtesting
議題類型
bug
難度面向新貢獻者的預計實作難度，1 表示很小改動，5 表示專家級工作。
3
預計時間有經驗貢獻者完成調查、實作、測試並準備 pull request 的粗略時間範圍。
1-2 days
活動狀態議題目前的可參與程度：新鮮、活躍、陳舊、阻塞或等待維護者輸入。
stale
清晰度議題是否清楚說明預期改動、驗收標準和下一步。
mostly clear
前置要求
Go programmingfamiliarity with etcdexperience with integration tests
新手友善度1-100 的估計分數，表示該議題對首次貢獻者的友善程度。
45
研究方向
Examine the flaky tests in sd/etcd and sd/etcdv3. Look at the test setup, especially how etcd instances are started and cleaned up. Investigate common causes of flakiness like race conditions or timing issues. Review the CircleCI build logs linked in the issue for specific failure patterns. Consider using testcontainers or a more robust test harness.