go-kit/kit

Fix sd/etcd and sd/etcdv3 integration test flakes

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#882 opened on 2019/06/06

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bughelp wanted

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説明

The sd/etcd and sd/etcdv3 integration tests are extremely flaky. I can generally expect them to trigger build failures on every PR. Here is one example.

I am going to disable those tests until they can be fixed. This issue is a plea for help from the community to fix them.

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