go-kit/kit

Fix sd/etcd and sd/etcdv3 integration test flakes

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#882 opened on Jun 6, 2019

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bughelp wanted

Description

The sd/etcd and sd/etcdv3 integration tests are extremely flaky. I can generally expect them to trigger build failures on every PR. Here is one example.

I am going to disable those tests until they can be fixed. This issue is a plea for help from the community to fix them.

Contributor guide

Tech stack
go
Domain
backendtesting
Issue type
bug
DifficultyEstimated implementation difficulty for a new contributor, from 1 for very small changes to 5 for expert-level work.
3
Estimated timeA rough time range for an experienced contributor to investigate, implement, test, and prepare a pull request.
1-2 days
Activity statusHow available the issue appears right now: fresh, active, stale, blocked, or waiting on maintainer input.
stale
ClarityHow clearly the issue explains the expected change, acceptance criteria, and next step.
mostly clear
Prerequisites
Go programmingfamiliarity with etcdexperience with integration tests
Newbie friendlinessA 1-100 score estimating how approachable this issue is for first-time contributors.
45
Research direction
Examine the flaky tests in sd/etcd and sd/etcdv3. Look at the test setup, especially how etcd instances are started and cleaned up. Investigate common causes of flakiness like race conditions or timing issues. Review the CircleCI build logs linked in the issue for specific failure patterns. Consider using testcontainers or a more robust test harness.